Dr. YoungHoon Kim, internationally recognized for holding the world’s highest documented intelligence score, has officially had his record-breaking IQ of 276 (SD = 24; equivalent to IQ 210 on SD 15) published in a peer-reviewed journal indexed in major international databases.
The article, titled “Modeling and Psychometric Evaluation of an Exceptionally High IQ Score of 276 in a Single Case Study,” appears in Testing, Psychometrics, Methodology in Applied Psychology (TPM) — a peer-reviewed journal indexed in PubMed, Scopus, PsycINFO, and Web of Science (ESCI).
This represents the first time in history that an IQ claim at such an extreme level has undergone rigorous peer review and been formally published in an academic psychology journal. The study documents in detail the psychometric modeling, statistical methodology, and multi-test validation that substantiate the reliability of Dr. Kim’s score.
“This publication demonstrates that meaningful and rigorous evaluation of extreme intelligence is possible, even at levels far beyond the traditional ceilings of standard IQ tests,” said Dr. Kim. “It is a milestone not only for me but for the scientific study of human intelligence itself.”
The research applied the WISC-V Extended Norms, Item Response Theory (IRT) modeling, and independent cross-validation to evaluate the case. The authors note that such extreme cases, while rare, contribute valuable insights to psychometric science and to the theoretical limits of human cognition.
Dr. Kim’s achievement has been recognized by multiple international organizations, but the peer-reviewed validation in an indexed journal now provides the highest level of scientific legitimacy to date. Experts anticipate that this publication will catalyze renewed interest, dialogue, and further research in the fields of intelligence and psychometrics.
The full article is available via the TPM journal:
https://tpmap.org/submission/index.php/tpm/article/view/1303/1090